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X-Ray Fluorescence Spectrometers Silicon - Pin XRF Detector

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X-Ray Fluorescence Spectrometers Silicon - Pin XRF Detector

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X-Ray Fluorescence Spectrometers Silicon - Pin XRF Detector 
XRF is used to detect and analyze noble metals like Gold ( Au), Silver (Ag), Platinum (Pt), Iridium (Ir), Osmium (Os), Palladium (Pd), Rhodium (Rh), Ruthenium (Ru),
Copper (Cu), Zinc (Zn), Nickel (Ni), Cadmium (Cd), Iron (Fe), Cobalt (Co), Indium (In), Tin (Sn), in the Jewellery Industry.
Energy Dispersive X-ray Fluorescence (EDXRF) technique relies on the detector and the detection circuit capability to resolve spectral peaks due to different energy X-Rays emitted when a primary X-Ray beam strikes a metal alloy corresponding to different elements in the sample, intensity of the spectrum radiation
proportional to the concentration of element. The spectrum is then processed through the powerful computer software which calculates and reports the various elements & their composition in the sample.
XRF Gold Purity Tester consists of X-Ray tube, high voltage power supply for X-Ray source, X-Ray tube filters, X-Ray fluorescence Detector, processing electronics and system interface & an external computer. A camera is incorporated in the system to view the sample on the computer screen.
Specifications
Catalogue No. JCGX-102
Detectable elements Titanium to Uranium
Measurement Results Iron (Fe), Cobalt (Co), Nickel (Ni), Copper (Cu), Zinc (Zn), Ruthenium (Ru), Rhodium (Rh), Palladium (Pd),Silver (Ag), Cadmium( Cd), Indium (In), Tin (Sn),Osmium (Os), Iridium (Ir), Platinum (Pt), Gold (Au) -all metals separately. 
Accuracy of measurement +0.15% (Molten Metal above 90% Au) +0.3% (Molten Metal below 90% Au)+0.5% (Molten Metal below 50% Au)
Sensor Silicon-Pin Diode (Silicon Drift Semiconductor or CGX-103)
Cooling for Detector Thermoelectric
Detection Range 1%-----99.99%
Testing Time 30-----200 secs
Test Spot Area 0.5mm
Power Supply 90-240 V AC, 50/60HZ
Power Rating 30 Watt
Working Temperature 15-25oC
Relative humidity <70%
Operation atmosphere Vibration free surface and air conditioned room
Interface for Computer Inbuilt (External Monitor, Keyboard required)
Software for Operation Menu Driven User Friendly Operating System
Dimensions of Instrument Length : 335mm   Width : 225mmHeight : 210mm (with test compartment cover in : closedposition) & 565mm (in open position)
Dimensions of Sample Chamber Length : 253mm   Width: 195mm    Height: 80mm
Net Weight 12kg
 
 
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X-Ray Fluorescence Spectrometers Silicon - Pin XRF Detector 
XRF is used to detect and analyze noble metals like Gold ( Au), Silver (Ag), Platinum (Pt), Iridium (Ir), Osmium (Os), Palladium (Pd), Rhodium (Rh), Ruthenium (Ru),
Copper (Cu), Zinc (Zn), Nickel (Ni), Cadmium (Cd), Iron (Fe), Cobalt (Co), Indium (In), Tin (Sn), in the Jewellery Industry.
Energy Dispersive X-ray Fluorescence (EDXRF) technique relies on the detector and the detection circuit capability to resolve spectral peaks due to different energy X-Rays emitted when a primary X-Ray beam strikes a metal alloy corresponding to different elements in the sample, intensity of the spectrum radiation
proportional to the concentration of element. The spectrum is then processed through the powerful computer software which calculates and reports the various elements & their composition in the sample.
XRF Gold Purity Tester consists of X-Ray tube, high voltage power supply for X-Ray source, X-Ray tube filters, X-Ray fluorescence Detector, processing electronics and system interface & an external computer. A camera is incorporated in the system to view the sample on the computer screen.
Specifications
Catalogue No. JCGX-102
Detectable elements Titanium to Uranium
Measurement Results Iron (Fe), Cobalt (Co), Nickel (Ni), Copper (Cu), Zinc (Zn), Ruthenium (Ru), Rhodium (Rh), Palladium (Pd),Silver (Ag), Cadmium( Cd), Indium (In), Tin (Sn),Osmium (Os), Iridium (Ir), Platinum (Pt), Gold (Au) -all metals separately. 
Accuracy of measurement +0.15% (Molten Metal above 90% Au) +0.3% (Molten Metal below 90% Au)+0.5% (Molten Metal below 50% Au)
Sensor Silicon-Pin Diode (Silicon Drift Semiconductor or CGX-103)
Cooling for Detector Thermoelectric
Detection Range 1%-----99.99%
Testing Time 30-----200 secs
Test Spot Area 0.5mm
Power Supply 90-240 V AC, 50/60HZ
Power Rating 30 Watt
Working Temperature 15-25oC
Relative humidity <70%
Operation atmosphere Vibration free surface and air conditioned room
Interface for Computer Inbuilt (External Monitor, Keyboard required)
Software for Operation Menu Driven User Friendly Operating System
Dimensions of Instrument Length : 335mm   Width : 225mmHeight : 210mm (with test compartment cover in : closedposition) & 565mm (in open position)
Dimensions of Sample Chamber Length : 253mm   Width: 195mm    Height: 80mm
Net Weight 12kg
 
 
Additional Information

Additional Information

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